Martins, R., Ferreira Cabrita Fortunato I. A. E. "
Improvement of a-Si:H device stability and performances by proper design of the interfaces."
Journal of Non-Crystalline Solids. 266-269 B (2000): 1094-1098.
AbstractThis paper deals with a new design method for the interfaces of a-Si:H pin solar cells that improves the stability and performances of devices deposited in a single batch chamber process. The method consists in removing a deposited sacrificial layer placed between the p/i and/or i/n interfaces by etching. This layer is an absorber of defects and impurities that are introduced in the interfaces, mainly from the chamber walls cross-contamination and the substrate surface. The results achieved increase the device fill factor and short circuit current density, respectively towards 75% and 16.3 mA cm-2, with a final efficiency of about 10%, before light soaking experiments. © 2000 Elsevier Science B.V. All rights reserved.
Martins, R., Ferreira Carvalho Guimarães I. N. L. "
Engineering of plasma deposition systems used for producing large area a-Si:H devices."
Journal of Non-Crystalline Solids. 137-138 (1991): 757-760.
AbstractOne of the main problems in producing large area amorphous silicon devices concerns films uniformity. In this paper we present data concerning the role of reactor geometry and design and on the film performances as well as the problems related to mechanical mismatches in scaling up the reactor size. © 1991 Elsevier Science Publishers B.V. All rights reserved.
Martins, R., Macarico Ferreira Nunes Bicho Fortunato A. I. R. "
Correlation between electrical-optical and structural properties of microcrystalline silicon N type films."
Materials Research Society Symposium - Proceedings. Vol. 420. 1996. 807-812.
AbstractWide band gap microcrystalline silicon films have aroused considerable interest since they combine some electro-optical advantages of amorphous and crystalline materials highly important to produce electro-optical devices such as TFTs and solar cells. In this paper we present results concerning the electro-optical characteristics of highly transparent and conductive n-type μc-Si based films. Here, emphasis is given to the production of n-type μc-films with optical gaps of 2.3 eV and dark conductivity's of 6.5 Scm-1.
Martins, R., Lavareda Soares Fortunato G. F. E. "
Detection limit of large area 1D thin film position sensitive detectors based in a-Si:H P.I.N. diodes."
Materials Research Society Symposium - Proceedings. Vol. 377. 1995. 791-796.
AbstractThe aim of this work is to provide the basis for the interpretation of the steady state lateral photoeffect observed in p-i-n a-Si:H 1D Thin Film Position Sensitive Detectors (1D TFPSD). The experimental data recorded in 1D TFPSD devices with different performances are compared with the predicted curves and the obtained correlation's discussed.
Martins, R., Fantoni Vieira A. M. "
Tailoring defects on amorphous silicon pin devices."
Journal of Non-Crystalline Solids. 164-166 (1993): 671-674.
AbstractThis paper deals with a new model and structure able to tailor defects in pin devices. The model assumes the usual density of states profile, including donor and acceptor like states inside the mobility gap and has the capability to simulate the transient and steady state device behavior. The new structure is based in two interfacial defectous layers, located at the junctions, acting as "gettering" centers to tailor the defects. The role of the interlayer and its thickness on device performances will be also discussed. © 1993.