Insights on amorphous silicon nip and MIS 3D position sensitive detectors

Citation:
b Martins, R.a, Costa Águas Soares Marques Ferreira Borges Pereira Raniero Fortunato D. a H. a. "Insights on amorphous silicon nip and MIS 3D position sensitive detectors." Materials Science Forum. 514-516 (2006): 13-17.

Abstract:

This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 μm with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

Notes:

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