Goulão, Miguel, and Fernando Brito Abreu. "
Formalizing Metrics for COTS."
International Workshop on Models and Processess for the Evaluation of COTS Components (MPEC 2004) at ICSE 2004. Eds. Eric Dubois, and Xavier Franch. Edimburgh, Scotland: IEE, 2004. 37-40.
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Fortunato, E., Pimentel Pereira Gonçalves Lavareda Águas Ferreira Carvalho Martins A. L. A. "
High field-effect mobility zinc oxide thin film transistors produced at room temperature."
Journal of Non-Crystalline Solids. 338-340 (2004): 806-809.
AbstractIn this paper we present the first results of thin film transistors produced completely at room temperature using ZnO as the active channel and silicon oxynitride as the gate dielectric. The ZnO-based thin film transistors (ZnO-TFT) present an average optical transmission (including the glass substrate) of 84% in the visible part of the spectrum. The ZnO-TFT operates in the enhancement mode with a threshold voltage of 1.8 V. A field effect mobility of 70 cm2/Vs, a gate voltage swing of 0.68 V/decade and an on-off ratio of 5×105 were obtained. The combination of transparency, high field-effect mobility and room temperature processing makes the ZnO-TFT very promising for the next generation of invisible and flexible electronics. © 2004 Elsevier B.V. All rights reserved.
Fortunato, E., Pimentel Gonçalves Marques Martins A. A. A. "
High mobility nanocrystalline indium zinc oxide deposited at room temperature."
Materials Research Society Symposium Proceedings. Vol. 811. 2004. 437-442.
AbstractIn this paper we present results of indium doped zinc oxide deposited at room temperature by rf magnetron sputtering, with electron mobility as high as 60 cm2/Vs. The films present a resistivity as low as 5×10 -4 Ωcm with an optical transmittance of 85%. The structure of these films look-like polymorphous (mixed of different amorphous and nanocrystalline phases from different origins) as detected from XRD patterns (no clear peak exists) with a high smooth surface, as detected from SEM micrographs, highly important to ensure long life time when used in display devices.
Fortunato, E.a, Assunção Gonçalves Marques Águas Pereira Ferreira Vilarinho Martins V. a A. a. "
High quality conductive gallium-doped zinc oxide films deposited at room temperature."
Thin Solid Films. 451-452 (2004): 443-447.
AbstractTransparent and highly conducting gallium-doped zinc oxide films were successfully deposited by rf sputtering at room temperature. The lowest resistivity achieved was 2.6×10-4 Ω cm for a thickness of 1100 nm (sheet resistance ≈1.6 Ω/sq), with a Hall mobility of 18 cm2/Vs and a carrier concentration of 1.3×1021 cm-3. The films are polycrystalline with a hexagonal structure and a strongly preferred orientation along the c-axis. A linear dependence between the mobility and the crystallite size was obtained. The films present a transmittance in the visible spectra between 80 and 90% and a refractive index of approximately 2, which is very close to the value reported for bulk material. © 2003 Elsevier B.V. All rights reserved.
Alendouro, M. S. J. G. a, R. C. C. a Monteiro, C. F. M. L. a Figueiredo, R. M. S. a Martins, R. J. C. a Silva, M. C. b Ferro, and M. H. V. b Fernandas. "
Microstructural characterization and properties of a glass and a glassceramic made from municipal incinerator bottom ash."
Materials Science Forum. 455-456 (2004): 827-830.
AbstractA glass was made using bottom ash produced by a Portuguese municipal solid waste (MSW) incinerator. The bottom ash was the single batch material used in the formation of the glass, which was obtained through a conventional melt-quenching method. The glass was then converted to glass-ceramic for further recycling to construction materials. After submitting the glass samples to several heat treatments, between 820 and 1050°C and during different times, it was verified that the optimum heat treatment schedule for the ceramization of the glass was at 1000°C for 10h, as confirmed by microstructural observation and by X-ray diffraction. The major crystalline phases precipitated in the glass-ceramic were wollastonite (CaSiO3) and diopside (Ca(Mg,Al)(Si,Al)2O6). Microstructural analysis of the glass-ceramic revealed that the crystalline phases were present as dendrites and fiber-like structures that were homogeneously distributed in the material. The glassceramic showed good mechanical properties with a hardness of 5.6 MPa and a bending strength of 101 MPa. This material had a density of 2.8 gcm-3 and a thermal expansion coefficient of 9.10-6°C-1. The glass and the glass-ceramic showed an excellent chemical stability against leaching in acidic solution and in alkaline solution. In summary, both the glass and the glass-ceramic have good chemical and mechanical properties and can, therefore, be applied as construction materials.
Fortunato, E., P. Barquinha, A. Pimentel, A. Goncalves, L. Pereira, A. Marques, and R. Martins. "
Next generation of thin film transistors based on zinc oxide."
Integration of Advanced Micro-and Nanoelectronic Devices-Critical Issues and Solutions. Eds. J. Morais, D. Kumar, M. Houssa, R. K. Singh, D. Landheer, R. Ramesh, R. M. Wallace, S. Guha, and H. Koinuma. Vol. 811. Materials Research Society Symposium Proceedings, 811. 2004. 347-352.
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Fortunato, E., Barquinha Pimentel Gonçalves Pereira Marques Martins P. A. A. "
Next generation of thin film transistors based on zinc oxide."
Materials Research Society Symposium Proceedings. Vol. 811. 2004. 347-352.
AbstractWe report high performance ZnO thin film transistor (ZnO-TFT) fabricated by rf magnetron sputtering at room temperature with a bottom gate configuration. The ZnO-TFT operates in the enhancement mode with a threshold voltage of 19 V, a field effect mobility of 28 cm2/Vs, a gate voltage swing of 1.39 V/decade and an on/off ratio of 3×105. The ZnO-TFT present an average optical transmission (including the glass substrate) of 80% in the visible part of the spectrum. The combination of transparency, high field-effect mobility and room temperature processing makes the ZnO-TFT a very promising low cost optoelectronic device for the next generation of invisible and flexible electronics.