Martins, R., L. Pereira, P. Barquinha, N. Correia, G. GONCALVES, I. Ferreira, C. Dias, and E. Fortunato. "
Floating gate memory paper transistor."
Oxide-Based Materials and Devices. Eds. F. H. Teherani, D. C. Look, C. W. Litton, and D. J. Rogers. Vol. 7603. Proceedings of SPIE, 7603. 2010.
Abstractn/a
Martins, R., L. Pereira, P. Barquinha, N. Correia, G. GONCALVES, I. Ferreira, C. Dias, and E. Fortunato. "
Floating gate memory paper transistor."
Oxide-Based Materials and Devices. Eds. F. H. Teherani, D. C. Look, C. W. Litton, and D. J. Rogers. Vol. 7603. Proceedings of SPIE, 7603. 2010.
Abstractn/a
Nunes, Isabel L., James Bliss, and Kellie King Joint influences of route familiarity and navigation system reliability on driving performance - Preliminary conclusions. Eds. P. Arezes, J. S. Baptista, M. P. Barroso, P. Carneiro, P. Cordeiro, N. Costa, R. Melo, A. S. Miguel, and G. P. Perestrelo. Occupational Safety and Hygiene (SHO10). Guimarães - Portugal: SPOSHO, 2010.
Abstractn/a
Barquinha, P., Pereira Gonçalves Martins Fortunato L. G. R. "
P-202L: Late-news poster: Long-term stability of oxide semiconductor-based TFTs."
48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010. Vol. 3. 2010. 1376-1379.
AbstractLong-term electrical stability measurements, including current/bias stress and aging over 18 months of idle shelf life are presented for GIZO-based TFTs. The effects of oxygen partial pressure, annealing temperature and passivation are discussed. Optimized devices show highly stable properties, such as a recoverable ΔVT<0.5 V after 24h of 1D=10 μA stress, quite promising for integration in electronic circuits.
Barquinha, P., Pereira Gonçalves Martins Fortunato L. G. R. "
P-202L: Late-news poster: Long-term stability of oxide semiconductor-based TFTs."
Digest of Technical Papers - SID International Symposium. Vol. 41 1. 2010. 1376-1379.
AbstractLong-term electrical stability measurements, including current/bias stress and aging over 18 months of idle shelf life are presented for GIZO-based TFTs. The effects of oxygen partial pressure, annealing temperature and passivation are discussed. Optimized devices show highly stable properties, such as a recoverable ΔV T<0.5 V after 24h of I D=10 μA stress, quite promising for integration in electronic circuits. © 2010 SID.