Cunha, José C., João M. Lourenço, and Tiago Antão. "
A Debugging Engine for a Parallel and Distributed Environment."
Proceedings of the 1st Austrian-Hungarian Workshop on Distributed and Parallel Systems (DAPSYS'96). Wien, Austria: Hungarian Academy of Sciences, KFKI, 1996. 111-118.
AbstractThis paper describes a debugging interface that has been developed for a parallel software engineering environment and that was developed on top of the PVM environment in the scope of the SEPP and HPCTI projects of the COPERNICUS Program. The main goal of this interface is to provide the basic debugging functionalities that are required by some components of that environment. We give special attention to the requirements posed by high-level tools of the environment, and to the need of providing a flexible debugging support layer that can be suitably adapted and extended. We present the system logical architecture and the interface specification of the debugging engine. We discuss its interfacing with other components of the environment, namely a graphical editor for the GRAPNEL visual parallel programming language, and a testing tool. We finally describe current work on the improvement of the debugging engine. Keywords: Debugging, monitoring, parallel processing, software tools.
b Vieira, M.a, Fantoni Koynov Cruz Maçarico Martins A. a S. a. "
Amorphous and microcrystalline silicon p-i-n optical speed sensors based on the flying spot technique."
Journal of Non-Crystalline Solids. 198-200 (1996): 1193-1197.
AbstractFrom the flying spot technique (FST) the ambipolar diffusion length and the effective-lifetime of the carriers photogenerated by a moving light spot that strikes a p-i-n junction can be inferred. In this paper, those properties of a p-i-n junction are used together with an optical triangulation principle to determine the velocity of an object that is moving in the direction of a light source. The light reflected back from the object is analysed through an amorphous or a microcrystalline p-i-n structure. Its transient transverse photovoltage is dependent on the velocity of the object. A comparison between the performances of both kinds of devices is presented.
Martins, R., Macarico Ferreira Nunes Bicho Fortunato A. I. R. "
Correlation between electrical-optical and structural properties of microcrystalline silicon N type films."
Materials Research Society Symposium - Proceedings. Vol. 420. 1996. 807-812.
AbstractWide band gap microcrystalline silicon films have aroused considerable interest since they combine some electro-optical advantages of amorphous and crystalline materials highly important to produce electro-optical devices such as TFTs and solar cells. In this paper we present results concerning the electro-optical characteristics of highly transparent and conductive n-type μc-Si based films. Here, emphasis is given to the production of n-type μc-films with optical gaps of 2.3 eV and dark conductivity's of 6.5 Scm-1.
Cunha, José C., João Louren{\c c}o, and Tiago Antão. "
A Debugging Engine for a Parallel and Distributed Environment."
Proceedings of the 1st Austrian-Hungarian Workshop on Distributed and Parallel Systems (DAPSYS’96). Hungarian Academy of Sciences, KFKI, 1996. 111-118.
AbstractThis paper describes a debugging interface that has been developed for a parallel software engineering environment and that was developed on top of the PVM environment in the scope of the SEPP and HPCTI projects of the COPERNICUS Program. The main goal of this interface is to provide the basic debugging functionalities that are required by some components of that environment. We give special attention to the requirements posed by high-level tools of the environment, and to the need of providing a flexible debugging support layer that can be suitably adapted and extended. We present the system logical architecture and the interface specification of the debugging engine. We discuss its interfacing with other components of the environment, namely a graphical editor for the GRAPNEL visual parallel programming language, and a testing tool. We finally describe current work on the improvement of the debugging engine. Keywords: Debugging, monitoring, parallel processing, software tools.
Cunha, José C., João Louren{\c c}o, and Tiago Antão. "
A Distributed Debugging Tool for a Parallel Software Engineering Environment."
Proceedings of the 1st European Parallel Tools Meeting (EPTM’96). ONERA (French National Establishment for Aerospace Research), 1996.
AbstractWe discuss issues in the design and implementation of a flexible debugging tool and its integration into a parallel software engineering environment.
Topic, M., Smole Furlan Fortunato Martins F. J. E. "
Examination of 1-D position sensitive detector performance through analysis of front contact heterojunction."
Materials Research Society Symposium - Proceedings. Vol. 420. 1996. 171-176.
AbstractThe influence of different TCOs (SnO2 and ITO) on the photoelectrical properties of 1-D position sensitive detectors based on p-i-n structures was studied. A strong cross-contamination in the p-layer and contamination in the i-layer reduce the quality of the device. Numerical analysis of TCO/p-i-n structure also revealed a strong increase in defect states at the p-layer surface which can be attributed to the reduction of TCO. ITO seems to be less appropriate for a front TCO, although the spectral response of the p-i-n structure under reverse bias is not significantly affected by the conditions at the TCO/p heterojunction.
Fortunato, Elvira, Lavareda Guilherme Martins Rodrigo Soares Fernando Fernandes Luis. "
From intelligent materials to smart sensors."
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2779. 1996. 269-274.
AbstractA Linear array Thin Film Position Sensitive Detector (LTFPSD) based on hydrogenated amorphous silicon (a-Si:H) is proposed for the first time, taking advantage of the optical properties presented by a-Si:H devices we have developed a LTFPSD with 128 integrated elements able to be used in 3D inspections/measurements. Each element consists on a 1D LTFPSD, based on a p.i.n. diode produced in a conventional PECVD system, where the doped layers are coated with thin resistive layers to establish the required device equipotentials. By proper incorporation of the LTFPSD into an optical inspection camera it will be possible to acquire information about an object/surface, through the optical cross- section method. The main advantages of this system, when compared with the conventional CCDs, are the low complexity of hardware and software used and that the information can be continuously processed (analogue detection).