Cunha, José C., João M. Lourenço, and Tiago Antão. "
A Debugging Engine for a Parallel and Distributed Environment."
Proceedings of the 1st Austrian-Hungarian Workshop on Distributed and Parallel Systems (DAPSYS'96). Wien, Austria: Hungarian Academy of Sciences, KFKI, 1996. 111-118.
AbstractThis paper describes a debugging interface that has been developed for a parallel software engineering environment and that was developed on top of the PVM environment in the scope of the SEPP and HPCTI projects of the COPERNICUS Program. The main goal of this interface is to provide the basic debugging functionalities that are required by some components of that environment. We give special attention to the requirements posed by high-level tools of the environment, and to the need of providing a flexible debugging support layer that can be suitably adapted and extended. We present the system logical architecture and the interface specification of the debugging engine. We discuss its interfacing with other components of the environment, namely a graphical editor for the GRAPNEL visual parallel programming language, and a testing tool. We finally describe current work on the improvement of the debugging engine. Keywords: Debugging, monitoring, parallel processing, software tools.
b Vieira, M.a, Fantoni Koynov Cruz Maçarico Martins A. a S. a. "
Amorphous and microcrystalline silicon p-i-n optical speed sensors based on the flying spot technique."
Journal of Non-Crystalline Solids. 198-200 (1996): 1193-1197.
AbstractFrom the flying spot technique (FST) the ambipolar diffusion length and the effective-lifetime of the carriers photogenerated by a moving light spot that strikes a p-i-n junction can be inferred. In this paper, those properties of a p-i-n junction are used together with an optical triangulation principle to determine the velocity of an object that is moving in the direction of a light source. The light reflected back from the object is analysed through an amorphous or a microcrystalline p-i-n structure. Its transient transverse photovoltage is dependent on the velocity of the object. A comparison between the performances of both kinds of devices is presented.
Martins, R., Macarico Ferreira Nunes Bicho Fortunato A. I. R. "
Correlation between electrical-optical and structural properties of microcrystalline silicon N type films."
Materials Research Society Symposium - Proceedings. Vol. 420. 1996. 807-812.
AbstractWide band gap microcrystalline silicon films have aroused considerable interest since they combine some electro-optical advantages of amorphous and crystalline materials highly important to produce electro-optical devices such as TFTs and solar cells. In this paper we present results concerning the electro-optical characteristics of highly transparent and conductive n-type μc-Si based films. Here, emphasis is given to the production of n-type μc-films with optical gaps of 2.3 eV and dark conductivity's of 6.5 Scm-1.