Zhang, S., L. Raniero, E. Fortunato, L. Pereira, N. Martins, P. Canhola, I. Ferreira, N. Nedev, H. Águas, and R. Martins. "
{Characterization of silicon carbide thin films prepared by VHF-PECVD technology}."
Journal of Non-Crystalline Solids. 338-340 (2004): 530-533.
Abstractn/a