{In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films}
Citation:
Martins, RMS, Silva, M. A. G., RJC, Fernandes, and FMB. "{In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films}." 455-456 (2004): 342-345.
