{Characterization of the density of states of polymorphous silicon films produced at 13.56 and 27.12 MHz using CPM and SCLC techniques}
Citation:
Raniero, L, Pereira, Zhang, and SB. "{Characterization of the density of states of polymorphous silicon films produced at 13.56 and 27.12 MHz using CPM and SCLC techniques}." 338 (2004): 206-210.
