Publications

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1997
Casalis, L., L. Gregoratti, M. Kiskinova, G. Margaritondo, FMB Fernandes, RJ Silva, GR Morrison, and AW Potts. "First results from the ESCA microscopy beamline on ELETTRA." Surface and Interface Analysis. 25.5 (1997): 374-379. Abstract
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2000
Fernandes, FMB, R. J. C. Silva, R. Delhez, and EJ Mittemeijer. "Profile shape analysis of XRD peaks of a quenched tool steel." European Powder Diffraction, Pts 1 and 2. Vol. 321-3. 2000. 716-719. Abstract
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Silva, R. J. C., FMB Fernandes, AJ Bottger, R. Delhez, and EJ Mittemeijer. "Stress state prediction applied to local composition changes." Ecrs 5: Proceedings of the Fifth European Conference on Residual Stresses. Vol. 347-3. 2000. 609-614. Abstract
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2001
Águas, H., P. Nunes, E. Fortunato, R. Silva, V. Silva, J. Figueiredo, F. Soares, and R. Martins. "Hydrogenated amorphous silicon / ZnO shottky heterojunction for position sensitive detectors." Materials Research Society Symposium - Proceedings. 664 (2001). AbstractWebsite
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2002
Nunes, P., F. M. Braz Fernandes, R. J. C. Silva, E. Fortunato, and R. Martins. "Structural characterisation of zinc oxide thin films produced by spray pyrolysis." Key Engineering Materials. 230-232 (2002): 599-602. AbstractWebsite
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Fernandes, FMB, R. Martins, MT Nogueira, R. J. C. Silva, P. Nunes, D. Costa, and I. Ferreira. "Structural characterisation of NiTi thin film shape memory alloys." Sensors and Actuators a-Physical. 99.1-2 (2002): 55-58. Abstract
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2003
Aguas, H., L. Pereira, A. Goullet, R. Silva, E. Fortunato, R. Martins, JR Abelson, G. Ganguly, H. Matsumura, J. Robertson, and EA Schiff. "Correlation between the tunnelling oxide and I-V curves of MIS photodiodes." Amorphous and Nanocrystalline Silicon-Based Films-2003. Vol. 762. 2003. 217-222. Abstract
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Águas, H., A. Gonçalves, L. Pereira, R. Silva, E. Fortunato, and R. Martins. "Spectroscopic ellipsometry study of amorphous silicon anodically oxidised." Thin Solid Films. 427.1-2 (2003): 345-349. AbstractWebsite
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Aguas, H., A. Goncalves, L. Pereira, R. Silva, E. Fortunato, and R. Martins. "Spectroscopic ellipsometry study of amorphous silicon anodically oxidised." Thin Solid Films. 427.1-2 (2003): 345-349. Abstract
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2004
Martins, R. M. S., R. J. C. Silva, FMB Fernandas, L. Pereira, P. R. Gordo, M. J. P. Maneira, and N. Schell. "In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films." Materials Science Forum. 455-456 (2004): 342-345. AbstractWebsite
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Alendouro, M. S. J. G., R. C. C. Monteiro, C. F. M. L. Figueiredo, R. M. S. Martins, R. J. C. Silva, M. C. Ferro, and M. H. V. Fernandas. "Microstructural characterization and properties of a glass and a glassceramic made from municipal incinerator bottom ash." Materials Science Forum. 455-456 (2004): 827-830. AbstractWebsite
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Fortunato, E., V. Assuncao, A. Marques, A. Goncalves, H. Aguas, L. Pereira, I. Ferreira, FMB Fernandes, R. J. C. Silva, R. Martins, and C. Dias. "ZnO : Ga thin films produced by RF sputtering at room temperature: Effect of the power density." Advanced Materials Forum Ii. 455-456 (2004): 12-15. Abstract
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Fortunato, E., V. Assunção, A. Marques, A. Gonçalves, H. Águas, L. Pereira, I. Ferreira, FMB Fernandes, R. J. C. Silva, and R. Martins. "ZnO:Ga thin films produced by RF sputtering at room temperature: Effect of the power density." Materials Science Forum. 455-456 (2004): 12-15. AbstractWebsite
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Aguas, H., L. Perreira, R. J. C. Silva, E. Fortunato, and R. Martins. "Effect of the tunnelling oxide growth by H2O2 oxidation on the performance of a-Si : H MIS photodiodes." Materials Science and Engineering B-Solid State Materials For Advanced Technology. 109.1-3 (2004): 256-259. Abstract
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2005
Martins, R. M. S., N. Schell, R. J. C. Silva, and FMB Fernandes. "Structural in situ studies of shape memory alloy (SMA) Ni-Ti thin films." Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 238.1-4 (2005): 319-322. AbstractWebsite
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Martins, R. M. S., N. Schell, R. J. C. Silva, and FMB Fernandes. "Structural in situ studies of shape memory alloy (SMA) Ni-Ti thin films." Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 238.1-4 (2005): 319-322. Abstract
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2006
Martins, R. M. S., FMB Fernandes, R. J. C. Silva, M. Beckers, N. Schell, and P. M. Vilarinho. "In-situ observation of Ni-Ti thin film growth by synchrotron radiation scattering." Advanced Materials Forum Iii, Pts 1 and 2. Vol. 514-516. 2006. 1588-1592. Abstract
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Silva, RJ, L. A. Matlakhova, E. C. Pereira, A. N. Matlakhov, S. N. Monteiro, and R. J. S. Rodríguez. "Thermal cycling treatment and structural changes in Cu-Al-Ni monocrystalline alloys." Materials Science Forum. 514-516.PART 1 (2006): 692-696. AbstractWebsite
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Martins, R. M. S., FMB Fernandes, R. J. C. Silva, L. Pereira, P. R. Gordo, M. J. P. Maneira, M. Beckers, A. Mucklich, and N. Schell. "The influence of a poly-Si intermediate layer on the crystallization behaviour of Ni-TiSMA magnetron sputtered thin films." Applied Physics a-Materials Science & Processing. 83.1 (2006): 139-145. Abstract
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Martins, R. M. S., N. Schell, M. Beckers, K. K. Mahesh, R. J. C. Silva, and FMB Fernandes. "Growth of sputter-deposited Ni-Ti thin films: Effect of a SiO2 buffer layer." Applied Physics a-Materials Science & Processing. 84.3 (2006): 285-289. Abstract
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Paula, AS, JHP Canejo, K. K. Mahesh, R. J. C. Silva, FMB Fernandes, R. M. S. Martins, AMA Cardoso, and N. Schell. "Study of the textural evolution in Ti-rich NiTi using synchrotron radiation." Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 246.1 (2006): 206-210. Abstract
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2007
Musat, V., E. Fortunato, Braz F. Fernandes, and Jorge Cordetro R. Silva. "Sol gel porous ZnO thin films for gas sensing applications." Journal of Optoelectronics and Advanced Materials. 9.5 (2007): 1395-1398. Abstract
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Martins, R. M. S., N. Schell, R. J. C. Silva, L. Pereira, K. K. Mahesh, and F. M. Braz Fernandes. "In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction." Sensors and Actuators B-Chemical. 126.1 (2007): 332-337. Abstract
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2008
Martins, Rui M. S., N. Schell, H. Reuther, L. Pereira, R. J. C. Silva, K. K. Mahesh, Braz F. M. Fernandes, AT Marques, AF Silva, APM Baptista, C. Sa, FJLA Alves, LF Malheiros, and M. Vieira. "Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques." Advanced Materials Forum Iv. Vol. 587-588. 2008. 672-676. Abstract
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Martins, Rui M. S., M. Beckers, A. Muecklich, N. Schell, R. J. C. Silva, K. K. Mahesh, Braz F. M. Fernandes, AT Marques, AF Silva, APM Baptista, C. Sa, FJLA Alves, LF Malheiros, and M. Vieira. "The Interfacial Diffusion Zone in Magnetron Sputtered Ni-Ti Thin Films Deposited on Different Si Substrates Studied by HR-TEM." Advanced Materials Forum Iv. Vol. 587-588. 2008. 820-823. Abstract
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