In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction

Citation:
Martins, R. M. S., N. Schell, R. J. C. Silva, L. Pereira, K. K. Mahesh, and F. M. Braz Fernandes. "In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction." Sensors and Actuators B-Chemical. 126.1 (2007): 332-337.

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