Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques

Citation:
Martins, Rui M. S., N. Schell, H. Reuther, L. Pereira, R. J. C. Silva, K. K. Mahesh, Braz F. M. Fernandes, AT Marques, AF Silva, APM Baptista, C. Sa, FJLA Alves, LF Malheiros, and M. Vieira. "Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques." Advanced Materials Forum Iv. Vol. 587-588. 2008. 672-676.

Abstract:

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