Spectroscopic ellipsometry study of amorphous silicon anodically oxidised

Citation:
Águas, H., A. Gonçalves, L. Pereira, R. Silva, E. Fortunato, and R. Martins. "Spectroscopic ellipsometry study of amorphous silicon anodically oxidised." Thin Solid Films. 427.1-2 (2003): 345-349.

Abstract:

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Notes:

ORCID Reference type: [bibtex]; ORCID Reference: [@article { cordeirosilva2003,title = {Spectroscopic ellipsometry study of amorphous silicon anodically oxidised},journal = {Thin Solid Films},year = {2003},volume = {427},number = {1-2},pages = {345-349},author = {Águas, H. and Gonçalves, A. and Pereira, L. and Silva, R. and Fortunato, E. and Martins, R.}}]

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