In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films

Citation:
Martins, R. M. S., R. J. C. Silva, FMB Fernandas, L. Pereira, P. R. Gordo, M. J. P. Maneira, and N. Schell. "In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films." Materials Science Forum. 455-456 (2004): 342-345.

Abstract:

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Notes:

ORCID Reference type: [bibtex]; ORCID Reference: [@article { cordeirosilva2004,title = {In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films},journal = {Materials Science Forum},year = {2004},volume = {455-456},pages = {342-345},author = {Martins, R.M.S. and Silva, R.J.C. and Fernandas, F.M.B. and Pereira, L. and Gordo, P.R. and Maneira, M.J.P. and Schell, N.}}]

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