We prove the inverse closedness of the Banach algebra \(\mathfrak{A}_p\) of functional operators with non-Carleman shifts, which have only two fixed points, in the Banach algebra of all bounded linear operators on \(L^p\). We suppose that \(1 \le p \le \infty\) and the generators of the algebra \(\mathfrak{A}_p\) have essentially bounded data. An invertibility criterion for functional operators in \(\mathfrak{A}_p\) is obtained in terms of
the invertibility of a family of discrete operators on \(l^p\). An effective invertibility criterion is established for binomial difference operators with \(l^\infty\) coefficients on the spaces \(l^p\). Using the reduction to binomial difference operators, we give effective criteria of invertibility for binomial functional operators on the spaces \(L^p\).

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In this paper we present results concerning the performance exhibited by an integrated array of 32 one-dimensional amorphous silicon thin film position sensitive detectors based on nip and hetero amorphous silicon structures, with a total active area size below 1 cm2 linearity, its spatial resolution and response time, that make it one of the most interesting analog detector to be used in unmanned optical inspection control systems where a continuous detection process is required. This opens a wide range of applications for amorphous silicon devices in the area of image processing. © 2002 Elsevier Science B.V. All rights reserved.

In this paper we present results concerning the optimisation of the electronic and mechanical properties presented by amorphous silicon (a-Si:H) thin films produced on polyimide (Kapton® VN) substrates with different thicknesses (25, 50 and 75 μm) by the plasma enhanced chemical vapour deposition (PECVD) technique. The purpose of this study is to obtain a low defect density as well as low residual stresses (specially at the interface) in order to provide good performances for large area (10 mm wide by 80 mm long) flexible position sensitive detectors. The electrical and optical properties presented by the films will be correlated to the sensor characteristics. The properties of samples have been measured by dark/photoconductivity, constant photocurrent measurements (CPM) and the results have been compared with films deposited on Corning 7059 glass substrates during the same run deposition. The residual stresses were measured using an active optical triangulation and angle resolved scattering. The preliminary results indicate that the thinner polymeric substrate with 25 μm presents the highest density of states, which is associated to the residual stresses and strains associated within the film. © 2002 Elsevier Science B.V. All rights reserved.