A collection of 155 accessions of ancient Portuguese common beans (Phaseolus vulgaris L) was evaluated in relation to the content of 8 minerals (Zn, Cu, Fe, Mn, Ca, Mg, P and K) important for human nutrition. A high degree of variability for P. Fe, Zn, Cu, Mn and Ca was observed in the collection. Total correlation matrix analysis revealed the existence of two important sets of strong positive correlations (P <= 0.0001), one involving P, Fe, Zn, Cu and protein, and the other Ca and Mn. The principal component analysis showed that Zn, Fe and Cu are highly correlated to the first component (27% of variability) and Mn and Ca to the second component (22% of the variability). The high mineral variability observed in the seeds of this common bean collection could be useful for the selection of cultivars with higher nutrition value and for the improvement of seed nutrition quality traits. (C) 2010 Elsevier Inc. All rights reserved.

For the characterization of the new materials and for a better understanding of the connection between structure and properties it is necessary to use more and more sensible methods to study molecular movement at nanometric scale. This paper presents the experimental basis for a new electrical method to study the fine molecular movements at nanometric scale in dielectric materials. The method will be applied for polar and non-polar materials characterization. Traditionally, the electrical methods used to study the molecular movements are based on the movements of the dipoles that are parts of the molecules. We have proposed recently a combined protocol to analyze charge injection/extraction, transport, trapping and detrapping in low mobility materials. The experimental results demonstrate that the method can be used to obtain a complex thermogram which contains information about all molecular movements, even at nanoscopic level. Actually during the charging process we are decorating the structure with space charge and during the subsequent heating we are observing an apparent peak and the genuine peaks that are related to charge de-trapping determined by the molecular movement. The method is very sensitive, very selective and allows to determinate the parameters for local and collective molecular movements, including the temperature dependence of the activation energy and the relaxation time.

The isothermal charging current and the isothermal discharging current in low mobility materials are analyzed either in terms of polarization mechanisms or in terms of charge injection/extraction at the metal-dielectric interface and the conduction current through the dielectric material. We propose to measure the open-circuit isothermal charging and discharging currents just to overpass the difficulties related to the analysis of the conduction mechanisms in dielectric materials. We demonstrate that besides a polarization current there is a current related to charge injection or extraction at the metal-dielectric interface and a reverse current related to the charge trapped into the shallow superficial or near superficial states of the dielectric and which can move at the interface in the opposite way that occurring during injection. Two important parameters can be determined (i) the highest value of the relaxation time for the polarization mechanisms which are involved into the transient current and (ii) the height of the potential barrier W-0 at the metal-dielectric interface. The experimental data demonstrate that there is no threshold field for electron injection/extraction at a metal-dielectric interface.