Thermoelectric properties of V2O5 thin films deposited by thermal evaporation

Citation:
Santos, R., Loureiro Nogueira Elangovan Pinto Veiga Busani Fortunato Martins Ferreira J. A. E. "Thermoelectric properties of V2O5 thin films deposited by thermal evaporation." Applied Surface Science. 282 (2013): 590-594.

Abstract:

This work reports the structural, optical, electrical and thermoelectric properties of vanadium pentoxide (V2O5) thin films deposited at room temperature by thermal evaporation on Corning glass substrates. A post-deposition thermal treatment up to 973 K under atmospheric conditions induces the crystallization of the as-deposited amorphous films with an orthorhombic V2O5 phase with grain sizes around 26 nm. As the annealing temperature rises up to 773 K the electrical conductivity increases. The films exhibit thermoelectric properties with a maximum Seebeck coefficient of -218 μV/K and electrical conductivity of 5.5 (Ω m) -1. All the films show NIR-Vis optical transmittance above 60% and optical band gap of 2.8 eV. © 2013 Elsevier B.V. All rights reserved.

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