@article {Santos2013590,
	title = {Thermoelectric properties of V2O5 thin films deposited by thermal evaporation},
	journal = {Applied Surface Science},
	volume = {282},
	year = {2013},
	note = {<p>cited By 19</p>
},
	pages = {590-594},
	abstract = {<p>This work reports the structural, optical, electrical and thermoelectric properties of vanadium pentoxide (V2O5) thin films deposited at room temperature by thermal evaporation on Corning glass substrates. A post-deposition thermal treatment up to 973 K under atmospheric conditions induces the crystallization of the as-deposited amorphous films with an orthorhombic V2O5 phase with grain sizes around 26 nm. As the annealing temperature rises up to 773 K the electrical conductivity increases. The films exhibit thermoelectric properties with a maximum Seebeck coefficient of -218 μV/K and electrical conductivity of 5.5 (Ω m) -1. All the films show NIR-Vis optical transmittance above 60\% and optical band gap of 2.8 eV. {\textcopyright} 2013 Elsevier B.V. All rights reserved.</p>
},
	doi = {10.1016/j.apsusc.2013.06.016},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84880928318\&partnerID=40\&md5=4699a3dca129783c1ef8bae6257fc631},
	author = {Santos, R., Loureiro, J., Nogueira, A., Elangovan, E., Pinto, J.V., Veiga, J.P., Busani, T., Fortunato, E., Martins, R., Ferreir}
}
