Production of low cost contacts and joins for large area devices by electrodeposition of Cu and Sn

Citation:
Ferreira, J.a, Seiroco Braz Fernandes Martins Fortunato Marvão Martins H. a F. a. "Production of low cost contacts and joins for large area devices by electrodeposition of Cu and Sn." Applied Surface Science. 168 (2000): 292-295.

Abstract:

The aim of this paper is to present results concerning the morphology, structure, mechanical and electrical characteristics of the new proposed Cu-Sn metallurgical alloy, which may be used in electronic joins. By proper choice of process temperature and pressure, Cu coated surfaces are soldered using Sn as pre-form. The main results achieved indicate that the formation of Cu3Sn phase begins at a temperature of about 473 K and that the Sn thickness (dSn) needed is slightly above 7 μm. Due to join wettability, higher temperatures (between 523 and 573 K) and dSn above 35 μm are required to form joins within the specifications of the electronic industry.

Notes:

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