Radiation-Tolerant Flexible Large-Area Electronics Based on Oxide Semiconductors
- Citation:
- Cramer, T.a, Sacchetti Lobato Barquinha Fischer Benwadih Bablet Fortunato Martins Fraboni A. a M. T. "Radiation-Tolerant Flexible Large-Area Electronics Based on Oxide Semiconductors." Advanced Electronic Materials. 2 (2016).
Abstract:
Large-area electronics for applications in environments with radioactive contamination or medical X-ray detectors require materials and devices resistant to continuous ionizing radiation exposure. Here the superior X-ray radiation hardness of oxide thin film transistors (TFTs) based on gallium-indium-zinc oxide is demonstrated, when compared to organic ones. In the experiments both TFTs are subjected to X-ray radiation and their performances are monitored as a function of total ionizing dose. Flexible oxide TFTs maintain a constant mobility of 10 cm2 V−1 s−1 even after exposure to doses of 410 krad(SiO2), whereas organic TFTs lose 55% of their transport performance. The exceptional resistance of oxide semiconductors ionization damage is attributed to their intrinsic properties such as independence of transport on long-range order and large heat of formation. © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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