Electrical properties of natural cork, commercial cork agglomerates (for floor and wall coverings) and a recently developed composite of cork/TetraPak (R) were studied. Measurements of isothermal charge and discharge currents were made for natural cork samples in different directions (axial, radial and tangential cuts). The isothermal current characteristics and the samples conductivity were investigated under different conditions (electric field, temperature and environmental conditions: in air at ambient relative humidity (RH), dry air and vacuum), also the samples could be or not conditioned (dried in vacuum or in a P2O5 atmosphere at room temperature). From these results the influence of water on the electrical properties of natural cork could be seen. In order to compare the three different cork materials a preliminary study was made. Isothermal charge and discharge currents and conductivity after 1h charging were measured and compared for different electric fields and temperature in air at ambient RH.

Electrochromic materials have attracted considerable attention during the last two decades as a consequence of their potential application in several different types of optical devices. Examples of these devices include intelligent windows and time labels. In this paper the authors describe results obtained with thin tungsten oxide films produced at room temperature by rf magnetron sputtering under an argon and oxygen atmosphere on transparent conductive oxide coated glass substrates. To protect the surface of the electrochromic film, prevent water absorption and obtain a good memory effect under open circuit voltages, a layer of Ta2O5 was deposited over the WO3 films. In this study, the effect of different electrolyte compositions on the open circuit memory of optical devices has been characterized. The best results were obtained for electrochromic devices with polymer gel p(TMC)3LiC1O4 and p(TMC)8LiClO 4 electrolytes. These prototype devices present an overall transmittance of ∼75% in their bleached state and after coloration 40.5 and 52.5% respectively. These devices also show memory effect and an optical density considered satisfactory for some electrochromic applications.

A series of amorphous silicon carbide films were prepared by plasma enhanced chemical vapor deposition technique on (100) silicon wafers by using methane, silane, and hydrogen as reactive resources. A very thin (around 15 Å) gold film was evaporated on the half area of the a-SiC:H films to investigate the metal induced crystallization effect. Then the a-SiC:H films were annealed at 1100°C for 1 hour in the nitrogen atmosphere. Fourier transform infrared spectroscopy (FTIR), X-Ray diffraction (XRD), and scanning electron microscopy (SEM) were employed to analyze the microstructure, composition and surface morphology of the films. The influences of the high temperature annealing on the microstructure of a-SiC:H film and the metal induced metallization were investigated.

Nanostructured silicon films were deposited on the amorphous to microcrystalline transition region by plasma enhanced chemical vapor deposition, using an rf frequency of 27.12 MHz. Micro-Raman spectroscopy data show that in the transition region the peaks typically associated with amorphous silicon are slightly shifted towards higher wavenumber and become narrow, which could be explained by the short range order improvement or by the incorporation of very small Si nanocrystallites. The hydrogen evolution spectra from samples deposited in this region show two peaks, one at low temperature (LT) and the other at high temperature (HT), around 698 K and 840 K, respectively. These peaks represent activation energies of 87 (LT) and 135 (HT) kJ/mol, respectively, as deduced from the so-called Kissinger's method. The solar cells fabricated using i-layers produced in this transition region show good performances, with current density = 14.96 mA/cm2, short circuit voltage = 0.95 V, and fill factor = 0.67, which leads to efficiencies of 9.52%. © 2006 Elsevier B.V. All rights reserved.

This work deals with the study of nanostructured/amorphous silicon solar cell deposited by plasma enhanced chemical vapor deposition at 27.12 MHz by impedance spectroscopy. The solar cell studied present fill factor of 0.67, open circuit voltage of 0.94 V and short-circuit current density of 14.48 mA/cm2, which leads to the efficiency of 9.12%. The impedance spectroscopy analysis was performed under dark and illumination conditions. The data obtained were used to define an electrical equivalent circuit model able to explain the role of the different solar cell components, including the interfaces, on the solar cell performance. © 2006 Elsevier B.V. All rights reserved.

The purpose of this work is to present in-depth electrical characterization on transparent TFTs, using zinc oxide produced at room temperature as the semiconductor material. Some of the studied aspects were the relation between the output conductance in the post-pinch-off regime and width-to-length ratios, the gate leakage current, the semiconductor/insulator interface traps density and its relation with threshold voltage. The main point of the analysis was focused on channel mobility. Values extracted using different methodologies, like effective, saturation and average mobility, are presented and discussed regarding their significance and validity. The evolution of the different types of mobility with the applied gate voltage was investigated and the obtained results are somehow in disagreement with the typical behavior found on classical silicon based MOSFETs, which is mainly attributed to the completely different structures of the semiconductor materials used in the two situations: while in MOSFETS we have monocrystalline silicon, our transparent TFTs use poly/nanocrystalline zinc oxide with grain sizes of about 10 nm.