CENIMAT/I3N, Campus de Caparica Gab 1.10 (Ext 11605) (jdvp@fct.unl.pt) (email)
Thermoelectric properties of V2O5 thin films deposited by thermal evaporation
Citation:
Santos, R., J. Loureiro, A. Nogueira, E. Elangovan, J. V. Pinto, J. P. Veiga, T. Busani, E. Fortunato, R. Martins, and I. Ferreira,
"Thermoelectric properties of V2O5 thin films deposited by thermal evaporation",
Applied Surface Science, vol. 282, pp. 590-594, 2013.