Thermoelectric properties of V2O5 thin films deposited by thermal evaporation

Citation:
Santos, R., J. Loureiro, A. Nogueira, E. Elangovan, J. V. Pinto, J. P. Veiga, T. Busani, E. Fortunato, R. Martins, and I. Ferreira, "Thermoelectric properties of V2O5 thin films deposited by thermal evaporation", Applied Surface Science, vol. 282, pp. 590-594, 2013.

Abstract:

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