CENIMAT/I3N, Campus de Caparica Gab 1.10 (Ext 11605) (jdvp@fct.unl.pt) (email)
Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc-Tin-Oxide Thin-Film Transistors
Citation:
Nayak, P. K., J. V. Pinto, G. Goncalves, R. Martins, and E. Fortunato,
"Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc-Tin-Oxide Thin-Film Transistors",
Journal of Display Technology, vol. 7, issue 12, pp. 640-643, 2011.