Citation:

Naia, Duarte M., P. M. Gordo, O. M. N. D. Teodoro, De A. P. Lima, and A. M. C. Moutinho. "{Characterisation of Ti / Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model}." Materials science forum. 636-637 (2010): 1097-1101.

Abstract:

In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.

Notes:

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