<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Naia, M Duarte</style></author><author><style face="normal" font="default" size="100%">Gordo, P M</style></author><author><style face="normal" font="default" size="100%">O. M. N. D. Teodoro</style></author><author><style face="normal" font="default" size="100%">Lima, A P De</style></author><author><style face="normal" font="default" size="100%">Moutinho, A M C</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">{Characterisation of Ti / Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model}</style></title><secondary-title><style face="normal" font="default" size="100%">Materials science forum</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">abstract</style></keyword><keyword><style  face="normal" font="default" size="100%">as function of the</style></keyword><keyword><style  face="normal" font="default" size="100%">depth of interfaces in</style></keyword><keyword><style  face="normal" font="default" size="100%">fractions of positron annihilation</style></keyword><keyword><style  face="normal" font="default" size="100%">from an s-w</style></keyword><keyword><style  face="normal" font="default" size="100%">implantation energy were estimated</style></keyword><keyword><style  face="normal" font="default" size="100%">in this work the</style></keyword><keyword><style  face="normal" font="default" size="100%">interfaces</style></keyword><keyword><style  face="normal" font="default" size="100%">into a function of</style></keyword><keyword><style  face="normal" font="default" size="100%">multilayer</style></keyword><keyword><style  face="normal" font="default" size="100%">multilayered structures was estimated</style></keyword><keyword><style  face="normal" font="default" size="100%">plot and then converted</style></keyword><keyword><style  face="normal" font="default" size="100%">sims</style></keyword><keyword><style  face="normal" font="default" size="100%">slow positron</style></keyword><keyword><style  face="normal" font="default" size="100%">the</style></keyword><keyword><style  face="normal" font="default" size="100%">the positron implantation profile</style></keyword><keyword><style  face="normal" font="default" size="100%">the sample depth through</style></keyword><keyword><style  face="normal" font="default" size="100%">thin films</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2010</style></year></dates><volume><style face="normal" font="default" size="100%">636-637</style></volume><pages><style face="normal" font="default" size="100%">1097–1101</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.&lt;/p&gt;
</style></abstract><notes><style face="normal" font="default" size="100%">&lt;p&gt;n/a&lt;/p&gt;
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