@article {Naia2010,
	title = {{Characterisation of Ti / Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model}},
	journal = {Materials science forum},
	volume = {636-637},
	year = {2010},
	note = {<p>n/a</p>
},
	pages = {1097{\textendash}1101},
	abstract = {<p>In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.</p>
},
	keywords = {abstract, as function of the, depth of interfaces in, fractions of positron annihilation, from an s-w, implantation energy were estimated, in this work the, interfaces, into a function of, multilayer, multilayered structures was estimated, plot and then converted, sims, slow positron, the, the positron implantation profile, the sample depth through, thin films},
	doi = {10.4028/www.scientific.net/MSF.636-637.1097},
	author = {Naia, M Duarte and Gordo, P M and O. M. N. D. Teodoro and Lima, A P De and Moutinho, A M C}
}
