Pinto, R. M., A. A. Dias, M. L. Costa, and J. P. Santos. "
Computational study on the ionization energies of benzyl azide and its methyl derivatives."
Journal of Molecular Structure: THEOCHEM. 948 (2010): 15-20.
AbstractIonization energies of benzyl azide (BA), C6H5CH2N3, its methyl derivatives, 2-, 3- and 4-methyl benzyl azide and (1-azidoethyl)benzene (2-, 3- and 4-MBA and 1-AEB), (CH3)C6H4CH2 N3, have been calculated with several basis sets, with M¯ller-Plesset and Hartree-Fock methods. The data are compared to the ionizations energies obtained from HeI photoelectron spectroscopy (UVPES) experiments, in order to support the correct assignment of the bands. The nature and character of the molecular orbitals are also discussed.
Teixeira, Bruno, João Louren{\c c}o, Eitan Farchi, Ricardo Dias, and Diogo Sousa. "
Detection of Transactional Memory anomalies using static analysis."
Proceedings of the 8th Workshop on Parallel and Distributed Systems: Testing, Analysis, and Debugging. PADTAD ’10. New York, NY, USA: ACM, 2010. 26-36.
AbstractTransactional Memory allows programmers to reduce the number of synchronization errors introduced in concurrent programs, but does not ensures its complete elimination. This paper proposes a pattern matching based approach to the static detection of atomicity violation, based on a path-sensitive symbolic execution method to model four anomalies that may affect Transactional Memory programs. The proposed technique may be used to to bring to programmer’s attention pairs of transactions that the programmer has mis-specified, and should have been combined into a single transaction. The algorithm first traverses the AST tree, removing all the non-transactional blocks and generating a trace tree in the path sensitive manner for each thread. The trace tree is a Trie like data structure, where each path from root to a leaf is a list of transactions. For each pair of threads, erroneous patterns involving two consecutive transactions are then checked in the trace tree. Results allow to conclude that the proposed technique, although triggering a moderate number of false positives, can be successfully applied to Java programs, correctly identifying the vast majority of the relevant erroneous patterns.
Neagu, E. R., R. M. Neagu, C. J. Dias, M. C. Lanca, P. Inacio, and J. N. Marat-Mendes. "
Electrical Method to Study the Weak Molecular Movements at Nanometric Scale in Low Mobility Materials."
Advanced Materials Forum V, Pt 1 and 2. Eds. L. G. Rosa, and F. Margarido. Vol. 636-637. Materials Science Forum, 636-637. 2010. 430-436.
AbstractFor the characterization of the new materials and for a better understanding of the connection between structure and properties it is necessary to use more and more sensible methods to study molecular movement at nanometric scale. This paper presents the experimental basis for a new electrical method to study the fine molecular movements at nanometric scale in dielectric materials. The method will be applied for polar and non-polar materials characterization. Traditionally, the electrical methods used to study the molecular movements are based on the movements of the dipoles that are parts of the molecules. We have proposed recently a combined protocol to analyze charge injection/extraction, transport, trapping and detrapping in low mobility materials. The experimental results demonstrate that the method can be used to obtain a complex thermogram which contains information about all molecular movements, even at nanoscopic level. Actually during the charging process we are decorating the structure with space charge and during the subsequent heating we are observing an apparent peak and the genuine peaks that are related to charge de-trapping determined by the molecular movement. The method is very sensitive, very selective and allows to determinate the parameters for local and collective molecular movements, including the temperature dependence of the activation energy and the relaxation time.
Emerging Trends in Technological Innovation, First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2010, Costa de Caparica, Portugal, February 22-24, 2010. Proceedings. Eds. Luis M. Camarinha-Matos, Pedro Pereira, and Luis Ribeiro. Vol. 314. DoCEIS, 314. Springer, 2010.
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