Influence of the patch field on work function measurements based on the secondary electron emission

Citation:
Bundaleski, N., J. Trigueiro, A. G. Silva, A. M. C. Moutinho, and O. M. N. D. Teodoro. "Influence of the patch field on work function measurements based on the secondary electron emission." JOURNAL OF APPLIED PHYSICS. 113.183720 (2013): 1-11.