{Spectroscopic ellipsometry study of nickel induced crystallization of a-Si}

Citation:
Pereira, L., H. Águas, M. Beckers, R. M. S. Martins, E. Fortunato, and R. Martins. "{Spectroscopic ellipsometry study of nickel induced crystallization of a-Si}." Journal of Non-Crystalline Solids. 352 (2006): 1204-1208.

Abstract:

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Notes:

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