{In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction} | Luís Miguel Nunes Pereira

{In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction}

Citation:: Martins, R., N. Schell, R. Silva, L. Pereira, K. MAHESH, and F. FERNANDES. "{In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction}." Sensors and Actuators B: Chemical. 126 (2007): 332-337.

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