{Nanostructure characterization of high k materials by spectroscopic ellipsometry}
- Citation:
- Pereira, L., H. Águas, E. Fortunato, and R. Martins. "{Nanostructure characterization of high k materials by spectroscopic ellipsometry}." Applied Surface Science. 253 (2006): 339-343.
Abstract:
n/a
Notes:
n/a
Related External Link