{Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques}
Citation:
Martins, M. S. Rui, Schell, N., Reuther, and H. "{Characterization of Ni-Ti (Shape Memory Alloy) Thin Film by in-situ XRD and Complementary ex-situ Techniques}." 587-588 (2008): 672-676.
