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Lopes, M. E., H. L. Gomes, M. C. R. Medeiros, P. Barquinha, L. Pereira, E. Fortunato, R. Martins, and I. Ferreira. "Gate-bias stress in amorphous oxide semiconductors thin-film transistors." Applied Physics Letters. 95.6 (2009): 063502-3. Abstract
Ley, L., AH Mahan, Y. Xu, E. Iwaniczko, DL Williamson, BP Nelson, Q. Wang, H. Umemoto, Y. Nozaki, and M. Kitazoe. "PART A." (2002). Abstract
Lavado, M., R. Martins, I. Ferreira, G. Lavareda, E. Fortunato, M. Vieira, and L. Guimarães. "Electron paramagnetic resonance of defects in doped microcrystalline silicon." Vacuum. 39.7 (1989): 791-794. Abstract