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Lavado, M., R. Martins, I. Ferreira, G. Lavareda, E. Fortunato, M. Vieira, and L. Guimarães. "Electron paramagnetic resonance of defects in doped microcrystalline silicon." Vacuum. 39.7 (1989): 791-794. Abstract
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Ley, L., AH Mahan, Y. Xu, E. Iwaniczko, DL Williamson, BP Nelson, Q. Wang, H. Umemoto, Y. Nozaki, and M. Kitazoe. "PART A." (2002). Abstract
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Lopes, M. E., H. L. Gomes, M. C. R. Medeiros, P. Barquinha, L. Pereira, E. Fortunato, R. Martins, and I. Ferreira. "Gate-bias stress in amorphous oxide semiconductors thin-film transistors." Applied Physics Letters. 95.6 (2009): 063502-3. Abstract
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