Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity

Citation:
Braz Fernandes, F. M., K. K. Mahesh, R. M. S. Martins, R. J. C. Silva, C. Baehtz, and J. von Borany. "Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity." Materials Characterization. 76 (2013): 35-38.

Abstract:

n/a

Notes:

n/a