%0 Journal Article %J Materials Characterization %D 2013 %T Simultaneous probing of phase transformations in Ni-Ti thin film shape memory alloy by synchrotron radiation-based X-ray diffraction and electrical resistivity %A Braz Fernandes, F. M. %A Mahesh, K.K. %A Martins, R. M. S. %A Silva, R.J.C. %A Baehtz, C. %A von Borany, J. %M WOS:000315366200005 %P 35-38 %R 10.1016/j.matchar.2012.11.009 %V 76 %X n/a %Z n/a %8 FEB 2013 %@ 1044-5803