The determination of the metal-dielectric interface barrier height from the open-circuit isothermal charging current

Citation:
Neagu, E. R., R. M. Neagu, C. J. Dias, C. M. Lanca, and J. N. Marat-Mendes, "The determination of the metal-dielectric interface barrier height from the open-circuit isothermal charging current", Journal of Applied Physics, vol. 104, no. 3, 2008.

Abstract:

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Notes:

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