João Duarte Neves Cruz
Professor Associado
Physics Department - Faculty of Sciences and Technology, New University of Lisbon
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Cruz, J.
Quantitative infrared analysis of the asymmetric stretching peak of SiO2 films thermally grown
. FCT-UNL. Lisbon: FCT-UNL, 1995.
engphysics-thesis-joaocruz.pdf
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