João Duarte Neves Cruz

Professor Associado

Physics Department - Faculty of Sciences and Technology, New University of Lisbon (email)

Quantitative infrared analysis of the asymmetric stretching peak of SiO2 films thermally grown

Citation:: Cruz, J. Quantitative infrared analysis of the asymmetric stretching peak of SiO2 films thermally grown. FCT-UNL. Lisbon: FCT-UNL, 1995.

Thesis Type:

Diploma thesis

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