Characterization of the density of states of polymorphous silicon films produced at 13.56 and 27.12 MHz using CPM and SCLC techniques

Citation:
Raniero, L., L. Pereira, Shibin Zhang, I. Ferreira, H. Águas, E. Fortunato, and R. Martins. "Characterization of the density of states of polymorphous silicon films produced at 13.56 and 27.12 MHz using CPM and SCLC techniques." Journal of non-crystalline solids. 338 (2004): 206-210.

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