Spectroscopic ellipsometry study of nickel induced crystallization of a-Si
- Citation:
- Pereira, L., H. Aguas, M. Beckers, R. M. S. Martins, E. Fortunato, and R. Martins. "Spectroscopic ellipsometry study of nickel induced crystallization of a-Si." Journal of non-crystalline solids. 352 (2006): 1204-1208.
Abstract:
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Notes:
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