Spectroscopic ellipsometry study of amorphous silicon anodically oxidised
- Citation:
- Águas, H., A. Gonçalves, L. Pereira, R. Silva, E. Fortunato, and R. Martins. "Spectroscopic ellipsometry study of amorphous silicon anodically oxidised." Thin Solid Films. 427 (2003): 345-349.
Abstract:
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Notes:
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