Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometry

Citation:
Pereira, L., H. Águas, M. Beckers, R. M. S. Martins, E. Fortunato, and R. Martins. "Metal contamination detection in nickel induced crystallized silicon by spectroscopic ellipsometry." Journal of Non-Crystalline Solids. 354 (2008): 2319-2323.

Abstract:

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Notes:

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