Characterization of Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry | Hugo Águas

Characterization of Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry

Citation:: Pereira, Luis, Hugo Aguas, Manfred Beckers, Rui M. S. Martins, Elvira Fortunato, and Rodrigo Martins. "Characterization of Nickel Induced Crystallized Silicon by Spectroscopic Ellipsometry." MRS Proceedings. Vol. 910. Cambridge University Press, 2006. 0910-A21.

Abstract:

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