Application of X-ray microtomography to the microstructural characterization of Al-based functionally graded materials

Citation:
Velhinho, A., and Ferreira Rocha Vignoles Cloetens S. C. L. A. Braz Fernandes, F.M. "Application of X-ray microtomography to the microstructural characterization of Al-based functionally graded materials." Adv. in Sci. & Technol.. 45 (2006): 1109-1116.

Abstract:

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