Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-sectional TEM and SEM

Citation:
Martins, R. M. S., A. Muecklich, N. Schell, R. J. C. Silva, K. K. Mahesh, and F. M. Braz Fernandes. "Characterization of Sputtered Shape Memory Alloy Ni-Ti Films by Cross-sectional TEM and SEM." Microscopy and Microanalysis. 14 (2008): 85-86.

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