<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Fortunato, E.a , Nunes, P.a , Marques, A.a , Costa, D.a , Águas, H.a , Ferreira, I.a , Costa, M.E.V.b , Godinho, M.H.a , Almeida</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Transparent, conductive ZnO:Al thin film deposited on polymer substrates by RF magnetron sputtering</style></title><secondary-title><style face="normal" font="default" size="100%">Surface and Coatings Technology</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2002</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">https://www.scopus.com/inward/record.uri?eid=2-s2.0-8344229317&amp;partnerID=40&amp;md5=7af938a84d7352b2d306536eefb0adbb</style></url></web-urls></urls><volume><style face="normal" font="default" size="100%">151-152</style></volume><pages><style face="normal" font="default" size="100%">247-251</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;p&gt;In this paper, we present the optical, electrical, structural and mechanical properties exhibited by aluminum-doped zinc oxide (ZnO:Al) thin films produced by RF magnetron sputtering on polymeric substrates (polyethylene terephthalate, PET; Mylar type D from Dupont®) with a standard thickness of 100 μm. The influence of the uniaxial tensile strain on the electrical resistance of these films was evaluated in situ for the first time during tensile elongation. In addition, the role of the thickness on the mechanical behavior of the films was also evaluated. The preliminary results reveal that the increase in electrical resistance is related to the number of cracks, as well as the crack width, which also depends on the film thickness. © 2002 Elsevier Science B.V. All rights reserved.&lt;/p&gt;
</style></abstract><notes><style face="normal" font="default" size="100%">&lt;p&gt;cited By 49&lt;/p&gt;
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