{\rtf1\ansi\deff0\deftab360

{\fonttbl
{\f0\fswiss\fcharset0 Arial}
{\f1\froman\fcharset0 Times New Roman}
{\f2\fswiss\fcharset0 Verdana}
{\f3\froman\fcharset2 Symbol}
}

{\colortbl;
\red0\green0\blue0;
}

{\info
{\author Biblio}{\operator }{\title Biblio RTF Export}}

\f1\fs24
\paperw11907\paperh16839
\pgncont\pgndec\pgnstarts1\pgnrestart
Lopes, M.E.a, Gomes Medeiros Barquinha Pereira Fortunato Martins Ferreira H. L. a M. "Gate-bias stress in amorphous oxide semiconductors thin-film transistors." \i Applied Physics Letters\i0 . 95 (2009).\par \par }