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Figueiredo, V.a, Elangovan Gon\'e7alves Franco Alves Park Martins Fortunato E. a G. a. "Electrical, structural and optical characterization of copper oxide thin films as a function of post annealing temperature." \i Physica Status Solidi (A) Applications and Materials Science\i0 . 206 (2009): 2143-2148.\par \par }