@conference {Fortunato2001,
	title = {Thin film metal oxide semiconductors deposited on polymeric substrates},
	booktitle = {Materials Research Society Symposium - Proceedings},
	volume = {666},
	year = {2001},
	note = {<p>cited By 0</p>
},
	pages = {F1131-F1136},
	abstract = {<p>Highly textured transparent conducting ZnO:Al thin films have been prepared by r.f. magnetron sputtering. The films were deposited on polyester (Mylar type D, 100 μm thickness) and glass substrates at room temperature. Surface stylus profiling, X-ray diffraction, scanning electron microscopy, transmission electron microscope and Hall effect measurements as a function of temperature have been used to characterize the produced films. The samples are polycrystalline with a hexagonal wurtzke structure and a strong crystallographic c-axis orientation (002) perpendicular to the substrate surface (columnar structure). The ZnO:Al thin films with a resistivity as low 3.6{\texttimes}10-2 Ωcm have been obtained, as deposited.</p>
},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-0035556455\&partnerID=40\&md5=fafda128374e389f2e8a44710c52c895},
	author = {Fortunato, E., Nunes, P., Marques, A., Costa, D., {\'A}guas, H., Ferreira, I., Costa, M.E.V., Martins, R.}
}
